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Scanning microscopy for nanotechnology : techniques and applications

Zhou, Weilie

Scanning microscopy for nanotechnology : techniques and applications - New York Springer 2007 - 522p. : 24cm.

Subjects--Topical Terms:
SCANNING ELECTRON MICROSCOPY -- TECHNIQUE : NANOTECHNOLOGY

Subjects--Index Terms: SCANNING ELECTRON MICROSCOPY -- TECHNIQUE

Dewey Class. No.: 578.15 Z-6S

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