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Atomic force microscopy in process engineering : introduction to AFM for improved processes and products

Bowen, W. Richard

Atomic force microscopy in process engineering : introduction to AFM for improved processes and products - Amsterdam Elsevier 2009 - 23cm. ; 283

Subjects--Topical Terms:
ATOMIC FORCE MICROSCOPY

Subjects--Index Terms: ATOMIC FORCE MICROSCOPY

Dewey Class. No.: 578 B73A

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