000 00463nam a2200145Ia 4500
008 170101s2009 xx 000 0 und d
082 _a578 B73A
100 _aBowen, W. Richard
245 0 _aAtomic force microscopy in process engineering : introduction to AFM for improved processes and products
260 _aAmsterdam
_bElsevier
_c2009
300 _a23cm. ; 283
650 _aATOMIC FORCE MICROSCOPY
653 _aATOMIC FORCE MICROSCOPY
942 _2ddc
_cB
999 _c147516
_d147516