000 00424nam a2200157Ia 4500
008 170101s1969 xx 000 0 und d
082 _a541.345 3 M91P
100 _aMURT, E.M.
245 0 _aPhysical measurements and analysis of thin films
260 _bN.Y.
_c1969
300 _a194p
440 _aProgress in analytical chemistry, v.2
650 _aSURFACE CHEMISTRY
653 _aSURFACE CHEMISTRY
942 _2ddc
_cB
999 _c45645
_d45645